X3750 Series X-Ray Inspection System


Complete inspection of glass containers at high line speeds up to 1200ppm, ensuring outstanding detection sensitivity of physical contaminants in jars up to 130mm in diameter.

Adjustable Angled X-ray Beam
Offering optimum beam geometry to inspect different types of jars, removing any blind spots within the jar for unrivalled glass-in-glass inspection.

Advanced Detector Technology
Unrivalled detector technoglogy ensures reliable detection levels are optimised for high speed container inspection.

Value-add Inspection Capabilities
In addition to contaminant detection the X3750 can inspect for accurate fill level and hosts an option to detect vacuum presence within the jar.

Mettler-Toledo Product Inspection