Product/Service

X3750 Series X-Ray Inspection System

Source: Mettler-Toledo Product Inspection

X3750

Complete inspection of glass containers at high line speeds up to 1200ppm, ensuring outstanding detection sensitivity of physical contaminants in jars up to 130mm in diameter.

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Adjustable Angled X-ray Beam
Offering optimum beam geometry to inspect different types of jars, removing any blind spots within the jar for unrivalled glass-in-glass inspection.

Advanced Detector Technology
Unrivalled detector technoglogy ensures reliable detection levels are optimised for high speed container inspection.

Value-add Inspection Capabilities
In addition to contaminant detection the X3750 can inspect for accurate fill level and hosts an option to detect vacuum presence within the jar.

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Mettler-Toledo Product Inspection