Crops like berries often pick up unwanted stones or glass during harvesting. Because both stones and glass are lower density materials, they are challenging for most x-ray inspection systems to detect.
Bulk inspection creates an additional problem. The overlapping layers create hundreds of high density image points that can look similar to stones or glass to standard single-energy x-ray systems, limiting detection of the target glass and rocks.
The Anritsu XR75 DualX uses dual-energy inspection to greatly enhance detection of lower density materials including the challenging glass and rocks. This technology enables reliable detection of these contaminants at low false reject rates – a true win-win solution for this difficult application.