Presentation
Presentation: High-Resolution High-Sensitivity Mass Analyzers For ICPMS
Source: Pittcon 2012
Basic idea of SF-MS
- Focus an entrance slit as object of an ion optical lens to the collector (exit slit, detector).
- The fundamental equation for SF-MS shows that mass/charge is directly proportional to the square of the magnetic field and the square of the radius of curvature and to the inverse of the accelerating voltage.
- Images of ions with different masses are generated at spatially separated positions, which is the precondition for true multicollection.
Register Today. It's Fast And Free.
The content you requested is only available to registered users of Food Online. By registering now, you'll get exclusive access to this piece of content and thousands of addtional articles and product reviews across our entire network of sites.
Already Registered? Sign In.
